GB/T 35410-2017 液相色譜-串聯四極質譜儀性能的測定方法

本標準規定了液相色譜-串聯四極桿質譜儀性能的測試方法,本標準適用于液相色譜-串聯四極桿質譜儀性能的測定。

Method of performance testing for liquid chromatography-tandem quadrupole masss spectrometry

GB/T 34826-2017 四極桿電感耦合等離子體質譜儀性能的測定方法

Method of performance testing for quadrupole inductively coupled plasma mass spectrometer

GB/T 25154-2010 電容法液相微量水分儀

GB/T 25154一2010 電容法液相微量水分儀 本標準規定了電容法液相微量水分儀的分類、要求 ，試驗方法、檢驗規則、使用說明書標志、包裝、 運輸，貯存等內容。 本標準適用于以三氧化二鋁電容為傳感器的液相微量水分儀 。

Capacitive liquid phase trace moisture meter

GB/T 21006-2007 表面化學分析 X射線光電子能譜儀和俄歇電子能譜儀 強度標的線性

本標準規定了兩種方法，用于測定 AES 和 XPS 譜儀強度標在容許線性離散限度范圍內的最大計數率。它也包括校正強度非線性的方法，以便那些譜儀可使用更高的最大計數率，對于這些譜儀相關的校正公式已被證明是有效的。

Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale

GB/T 13979-1992 氦質譜檢漏儀

本標準規定了氦質譜檢漏儀的技術要求、試驗方法、檢驗規則和包裝貯運要求。 本標準適用于以氦-4做為示漏氣體，以質譜分析法作為檢測手段的檢漏儀（以下簡稱儀器）。

Helium mass spectrometer leak detector

T/CIS 17004-2020 直接質譜離子化裝置

前言　II 引言　III 1  范圍　1 2  規范性引用文件　1 3  術語和定義　1 4  分類　2 5  要求　2 5.1  工作條件　2 5.2  外觀與結構　2 5.3  性能要求　3 5.4  安全要求　3 5.5  運輸及貯存　4 5.6  環境適應性　4 5.7  電磁兼容性　4 5.8  成套性　4 6  試驗方法　4 6.1  試驗條件　4 6.2  標準物質　5 6.3  外觀與結構　5 6.4  性能要求　5 6.5  安全要求　6 6.6  運輸及貯存　6 6.7  環境適應性　6 6.8  電磁兼容性　7 6.9  成套性　7 7  檢驗規則　7 7.1  檢驗分類　7 7.2  出廠檢驗　7 7.3  型式檢驗　7 8  標志、包裝、運輸和貯存　7 8.1  標志　7 8.2  包裝　8 8.3  運輸　8 8.4  貯存　8 附錄A（資料性）  二維離子化裝置　9 附錄B（資料性）  三維離子化裝置　11

Ambient ionization device

JJF 1531-2015 傅立葉變換質譜儀校準規范

本規范適用于傅立葉變換質譜儀的校準。

Calibration Specification for Fourier Transform Mass Spectrometers

JJF 1528-2015 飛行時間質譜儀校準規范

本規范適用于電噴霧-飛行時間質譜儀和基質輔助激光誘導解吸飛行時間質譜儀的校準，其他類型的飛行時間質譜儀可參照本規范進行校準。

Calibration Specification for Time-of-Flight Mass Spectrometers

DIN 51418-2:2015 X射線光譜分析.X射線散射和X射線熒光分析(RFA).第2部分:定義和測量、校準及評估的基本原則

X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results

JJF 1508-2015 同位素豐度測量基準方法

同位素豐度測量基準方法適用于使用電感耦合等離子體質譜儀(ICP-MS)、熱電離質譜儀(TIMS)、同位素比質譜儀(IRMS)等類型質譜儀器準確測量元素的同位素豐度、組成或同位素比值。

Primary Method of Isotopic Abundance Measurement

JJG 629-2014 多晶X射線衍射儀檢定規程

本規程適用于多晶X射線衍射儀(以下簡稱儀器)的首次檢定、后續檢定和使用中檢查。

Polycrystalline X-Ray Diffractometers

BS ISO 16129:2012 表面化學分析.X射線光電子能光譜學.X射線光電子能譜儀日常性能評估規程

Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

BS ISO 15632:2012 微束分析. 用于電子探針顯微分析的能量分散X射線光譜儀規范和檢查用所選儀器性能參數

Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

JJF 1317-2011 液相色譜-質譜聯用儀校準規范

本規范適用于離子阱、單四極桿和三重四極桿型液相色譜-質譜聯用儀（以下簡稱LC-MS)的校準。

Calibration Specification for Liquid Chromatography-Mass Spectrometers

JJF 1290-2011 微粒檢測儀校準規范

本規范適用于采用不溶性微粒檢測法（光阻法），測量粒徑范圍為2μm～100μm,微粒濃度范圍為每1mL中含10～100000個微粒的微粒檢測儀的校準。

Calibration Specification for Particulate Analyzer

ASTM E493/E493M-11 在里外試驗法中用質譜儀檢漏器作泄漏檢驗的標準操作規程

Methods A or B are useful in testing hermetically-sealed devices with internal volumes. Maximum acceptable leak rates have been established for microelectronic devices to assure performance characteristics will not be affected by in-leakage of air, water vapor or other contaminants over the projected life expected. Care must be taken to control the bombing pressure, bombing time and dwell time after bombing or the results can vary substantially.1.1 This practice covers procedures for testing devices that are sealed prior to testing, such as semiconductors, hermetically enclosed relays, pyrotechnic devices, etc., for leakage through the walls of the enclosure. They may be used with various degrees of sensitivity (depending on the internal volume, the strength of the enclosure, the time available for preparation of test, and on the sorption characteristics of the enclosure material for helium). In general practice the sensitivity limits are from 10−10 to 10−6 Pa m3/s (10−9 standard cm3/s to 10−5 standard cm3/s at 0°C) for helium, although these limits may be exceeded by several decades in either direction in some circumstances. 1.2 Two test methods are described: 1.2.1 Test Method A8212;Test part preparation by bombing. 1.2.2 Test Method B8212;Test part preparation by prefilling. 1.3 Units8212;The values stated in either SI or std-cc/sec units are to be regarded separately as standard. The values stated in each system may not be exact equivalents: therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with the standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Leaks Using the Mass Spectrometer Leak Detector in the Inside-Out Testing Mode

ASTM E499/E499M-11 在檢測器探針法中用質譜儀檢漏器作泄漏檢驗的標準操作規程

Test Method A is frequently used to test large systems and complex piping installations that can be filled with a trace gas. Helium is normally used. The test method is used to locate leaks but cannot be used to quantify except for approximation. Care must be taken to provide sufficient ventilation to prevent increasing the helium background at the test site. Results are limited by the helium background and the percentage of the leaking trace gas captured by the probe. Test Method B is used to increase the concentration of trace gas coming through the leak by capturing it within an enclosure until the signal above the helium background can be detected. By introducing a calibrated leak into the same volume for a recorded time interval, leak rates can be measured.1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 1 × 10−7 Pa m3/s (1 × 10−8 Std cm3/s) or greater. The test may be conducted on any device or component across which a pressure differential of helium or other suitable tracer gas may be created, and on which the effluent side of the leak to be tested is accessible for probing with the mass spectrometer sampling probe. 1.2 Two test methods are described: 1.2.1 Test Method A8212;Direct probing, and 1.2.2 Test Method B8212;Accumulation. 1.3 Units8212;The values stated in either SI or std-cc/sec units are to be regarded separately as standard. The values stated in each system may not be exact equivalents: therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with the standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode

ASTM E498/E498M-11 在示蹤探針法中用質譜儀檢漏器或殘余氣體分析器作泄漏檢驗的標準操作規程

Test Method A is the most frequently used in leak testing components which are structurally capable of being evacuated to pressures of 0.1 Pa (approximately 10−3 torr). Testing of small components can be correlated to calibrated leaks, and the actual leak rate can be measured or acceptance can be based on a maximum allowable leak. For most production needs acceptance is based on acceptance of parts leaking less than an established standard which will ensure safe performance over the projected life of the component. Care must be exercised to ensure that large systems are calibrated with reference leak at a representative place on the test volume. Leak rates are determined by calculating the net gain or loss through a leak in the test part that would cause failure during the expected life of the device. Test Method B is used for testing vacuum systems either as a step in the final test of a new system or as a maintenance practice on equipment used for manufacturing, environmental test or for conditioning parts. As the volume tends to be large, a check of the response time as well as system sensitivity should be made. Volume of the system in liters divided by the speed of the vacuum pump in L/s will give the response time to reach 63 % of the total signal. Response times in excess of a few seconds makes leak detection difficult. Test Method C is to be used only when there is no convenient method of connecting the leak detector to the outlet of the high vacuum pump. If a helium leak detector is used and the high vacuum pump is an ion pump or cryopump, leak testing is best accomplished during the roughing cycle as these pumps leave a relatively high percentage of helium in the high vacuum chamber. This will obscure all but large leaks, and the trace gas will quickly saturate the pumps.1.1 This practice covers procedures for testing and locating the sources of gas leaking at the rate of 1 × 10−8 Pa m3/s (1 × 10−9 Std cm 3/s) or greater. The test may be conducted on any object to be tested that can be evacuated and to the other side of which helium or other tracer gas may be applied. 1.2 Three test methods are described: 1.2.1 Test Method A8212;For the object under test capable of being evacuated, but having no inherent pumping capability. 1.2.2 Test Method B8212;For the object under test with integral pumping capability. 1.2.3 Test Method C8212;For the object under test as in Test Method B, in which the vacuum pumps of the object under test replace those normally used in the leak detector. 1.3 Units8212;The values stated in either SI or std-cc/sec units are to be regarded separately as standard. The values stated in each system may not be exact equivalents: therefore, each system shall be used independently of the other. Combining values from the two systems may result in non-conformance with the standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Leaks Using the Mass Spectrometer Leak Detector or Residual Gas Analyzer in the Tracer Probe Mode

DIN 51418-1:2008 X射線光譜測定法.X射線散射和X射線熒光分析(XRF).第1部分:定義和基本原理

X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles

JJF 1159-2006 四極桿電感耦合等離子體質譜儀校準規范

本規范適用于四級桿電感耦合等離子體質譜儀主要性能指標的校準。其他類型的電感耦合離子體質譜儀的校準可以參照執行。

Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers